Lua APA (7ú heag.)

United States. Department of Defense. (1965). Reliability stress and failure rate data for electronic equipment. Department of Defense.

Lua i Stíl Chicago (17ú heag.)

United States. Department of Defense. Reliability Stress and Failure Rate Data for Electronic Equipment. Washington, D.C.: Department of Defense, 1965.

Lua MLA (8ú heag.)

United States. Department of Defense. Reliability Stress and Failure Rate Data for Electronic Equipment. Department of Defense, 1965.

Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.