International Symposium on Electron Microscopy /
This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society.
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| Corporate Authors: | , |
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| Other Authors: | , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Teaneck, N.J. :
World Scientific,
1990.
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| Subjects: |
| Summary: | This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society. |
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| Physical Description: | xii, 478 p. : ill. ; 23 cm. |
| Bibliography: | Includes bibliographies. |
| ISBN: | 9810205317 |