Interferometry VI--applications : 14-15 July 1993, San Diego, California /
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| Corporate Authors: | , |
|---|---|
| Other Authors: | , , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
c1994.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2004. |
| Subjects: |
| Physical Description: | x, 362 p. : ill. ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819412538 |