Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /
Shranjeno v:
| Glavni avtor: | |
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| Korporativna značnica: | |
| Format: | Knjiga |
| Jezik: | English |
| Izdano: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1992.
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| Serija: | Semiconductor measurement technology
NIST special publication ; 400-89 |
| Teme: |
CARM 1 Store
| Signatura: |
A3:AE31C0 F06472 |
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| Kopija 1 | Prosto Rezerviraj |