Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Sábháilte in:
Sonraí bibleagrafaíochta
Príomhchruthaitheoir: Albers, John
Údar corparáideach: National Institute of Standards and Technology (U.S.)
Formáid: LEABHAR
Teanga:English
Foilsithe / Cruthaithe: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Sraith:Semiconductor measurement technology
NIST special publication ; 400-89
Ábhair:
Semiconductors > Thermal properties.
Thermal analysis > Computer programs.
Fourier analysis > Data processing.
Cur síos
Cur síos ar an mír:"June 1992."
Cur síos fisiciúil:iii, 29 p. ; 28 cm.
Leabharliosta:Includes bibliographical references (p. 18)

Míreanna comhchosúla