Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Uloženo v:
Podrobná bibliografie
Hlavní autor: Albers, John
Korporativní autor: National Institute of Standards and Technology (U.S.)
Médium: Kniha
Jazyk:English
Vydáno: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Edice:Semiconductor measurement technology
NIST special publication ; 400-89
Témata:
Semiconductors > Thermal properties.
Thermal analysis > Computer programs.
Fourier analysis > Data processing.
Popis
Popis jednotky:"June 1992."
Fyzický popis:iii, 29 p. ; 28 cm.
Bibliografie:Includes bibliographical references (p. 18)

Podobné jednotky