Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Đã lưu trong:
Chi tiết về thư mục
Tác giả của công ty: National Institute of Standards and Technology (U.S.)
Tác giả khác: Baghdadi, A., Scace, Robert I., Walters, E. Jane
Định dạng: Sách
Ngôn ngữ:English
Được phát hành: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989.
Loạt:Semiconductor measurement technology
NIST special publication ; 400-82
Những chủ đề:
Silicon > Measurement > Databases.
Silicon > Measurement > Statistical methods.
Oxygen > Measurement > Databases.
Oxygen > Measurement > Statistical methods.
Infrared spectroscopy > Databases.
Infrared spectroscopy > Statistical methods.

CARM 1 Store

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Số hiệu: A3:AE31C0 F06472
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