Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Sábháilte in:
Sonraí bibleagrafaíochta
Údar corparáideach: National Institute of Standards and Technology (U.S.)
Rannpháirtithe: Baghdadi, A., Scace, Robert I., Walters, E. Jane
Formáid: LEABHAR
Teanga:English
Foilsithe / Cruthaithe: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989.
Sraith:Semiconductor measurement technology
NIST special publication ; 400-82
Ábhair:
Silicon > Measurement > Databases.
Silicon > Measurement > Statistical methods.
Oxygen > Measurement > Databases.
Oxygen > Measurement > Statistical methods.
Infrared spectroscopy > Databases.
Infrared spectroscopy > Statistical methods.
Cur síos
Cur síos ar an mír:"July 1989."
Cur síos fisiciúil:x, 168 p. : ill. ; 28 cm.
Leabharliosta:Includes bibliographical references.

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