Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

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التفاصيل البيبلوغرافية
مؤلف مشترك:	National Institute of Standards and Technology (U.S.)
مؤلفون آخرون:	Baghdadi, A., Scace, Robert I., Walters, E. Jane
التنسيق:	كتاب
اللغة:	English
منشور في:	Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989.
سلاسل:	Semiconductor measurement technology NIST special publication ; 400-82
الموضوعات:	Silicon > Measurement > Databases. Silicon > Measurement > Statistical methods. Oxygen > Measurement > Databases. Oxygen > Measurement > Statistical methods. Infrared spectroscopy > Databases. Infrared spectroscopy > Statistical methods.

الوصف
وصف المادة:	"July 1989."
وصف مادي:	x, 168 p. : ill. ; 28 cm.
بيبلوغرافيا:	Includes bibliographical references.

مواد مشابهة