Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

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书目详细资料
企业作者: National Institute of Standards and Technology (U.S.)
其他作者: Baghdadi, A., Scace, Robert I., Walters, E. Jane
格式: 图书
语言:English
出版: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989.
丛编:Semiconductor measurement technology
NIST special publication ; 400-82
主题:
Silicon > Measurement > Databases.
Silicon > Measurement > Statistical methods.
Oxygen > Measurement > Databases.
Oxygen > Measurement > Statistical methods.
Infrared spectroscopy > Databases.
Infrared spectroscopy > Statistical methods.
实物特征
Item Description:"July 1989."
实物描述:x, 168 p. : ill. ; 28 cm.
参考书目:Includes bibliographical references.

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