Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Salvato in:
Dettagli Bibliografici
Autore principale: Schuster, C. E.
Enti autori: United States. Defense Advanced Research Projects Agency, U.S. Air Force Wright Laboratory
Natura: Libro
Lingua:English
Pubblicazione: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
Serie:Semiconductor measurement technology
NIST special publication.
Soggetti:
Microwave integrated circuits > Design > Data processing.
Gallium arsenide semiconductors > Design > Data processing.
Computer-aided design.
Descrizione
Descrizione del documento:"September 1995."
Descrizione fisica:iv, 88 p. : ill. ; 28 cm.
Bibliografia:Includes bibliographical references (p. 14)

Documenti analoghi