Proceedings /

Proceedings /

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Bibliografske podrobnosti
Prejšnji naslov:International Test Conference. Digest of papers
Corporate Authors: International Test Conference, IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Revija
Jezik:English
Izdano: Silver Spring, Md. : IEEE Computer Society Press, 1983-.
Teme:
Computer storage devices > Congresses.
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.
Opis
Izdano:1983-
Opis knjige/članka:Each conference also has distinctive title.
Fizični opis:v. : ill. ; 28 cm.
ISSN:1089-3539
0743-1686

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