Proceedings /

Proceedings /

Saved in:
Bibliographic Details
Previous Title:International Test Conference. Digest of papers
Corporate Authors: International Test Conference, IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Journal
Language:English
Published: Silver Spring, Md. : IEEE Computer Society Press, 1983-.
Subjects:
Computer storage devices > Congresses.
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.
Description
Published:1983-
Item Description:Each conference also has distinctive title.
Physical Description:v. : ill. ; 28 cm.
ISSN:1089-3539
0743-1686

Similar Items