HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /

HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /

Spremljeno u:
Bibliografski detalji
Glavni autor: Albers, John
Autor kompanije: National Institute of Standards and Technology (U.S.)
Format: Knjiga
Jezik:English
Izdano: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
Serija:NIST special publication ; 400-96.
Semiconductor measurement technology.
Teme:
Semiconductors > Thermal properties.
Thermal analysis > Computer programs.
Fourier analysis > Data processing.

CARM 1 Store

Detalji primjeraka od CARM 1 Store
Signatura: A3:AE21D0 F06324
Primjerak 1 Dostupno  Postavi narudžbu

Similar Items