HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /
Saved in:
| Main Author: | |
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| Corporate Author: | |
| Format: | Book |
| Language: | English |
| Published: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
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| Series: | NIST special publication ;
400-96. Semiconductor measurement technology. |
| Subjects: |
CARM 1 Store
| Call Number: |
A3:AE21D0 F06324 |
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| Copy 1 | Available Place a Hold |