Fundamentals of surface and thin film analysis /

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Bibliographic Details
Main Author: Feldman, Leonard C.
Other Authors: Mayer, James W., 1930-
Format: Book
Language:English
Published: New York : North-Holland, c1986.
Subjects:
Description
Item Description:Includes bibliographical references and index.
Physical Description:xviii, 352, [2] p. : ill. ; 24 cm.
Bibliography:Includes bibliographies and index.
ISBN:0444009892