Properties of strained and relaxed silicon germanium /

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Bibliographic Details
Corporate Authors: Institution of Electrical Engineers, INSPEC (Information service). Electronic Materials Information Service
Other Authors: Kasper, E.
Format: Book
Language:English
Published: London : INSPEC, c1995.
Series:EMIS datareviews series ; no. 12
Subjects:
Description
Item Description:On title page: IEE.
Physical Description:xiv, 232 p. : ill. ; 29 cm.
Bibliography:Includes bibliographies and index.
ISBN:0852968264