Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /

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Bibliographic Details
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Seiler, David G.
Format: Book
Language:English
Published: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Series:Semiconductor measurement technology
NIST special publication ; 400-94
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Description
Item Description:"April 1994."
Physical Description:1 v. (various pagings) : ill. ; 28 cm.
Bibliography:Includes bibliographical references.