Yield and variability optimization of integrated circuits /
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| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston :
Kluwer Academic Publishers,
c1995.
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| Schlagworte: |
Inhaltsangabe:
- 1. Introduction
- 2. Overview of IC Statistical Modeling
- 3. Design of Experiments
- 4. Parametric Yield Maximization
- 5. Variability Minimization and Tuning
- 6. Worst-Case Measure Reduction
- 7. Multi-Objective Circuit Optimization
- A Commonly Used Orthogonal Arrays
- B Spice3 Input Decks.