Semiconductor measurement technology.

Semiconductor measurement technology. quarterly report.

Guardado en:
Detalles Bibliográficos
Nuevo Título:Institute for Applied Technology (U.S.). Electronic Technology Division. Semiconductor measurement technology: progress report
Título anterior:United States. National Bureau of Standards. Methods of measurement for semiconductor materials, process control, and devices; quarterly report
Autor Corporativo: Institute for Applied Technology (U.S.). Electronic Technology Division
Formato: Revista
Lenguaje:English
Publicado: [Washington] : U.S. Dept. of Commerce, National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.].
Colección:NBS special publication
Materias:
Semiconductors > Testing > Periodicals.

CARM 1 Store

Detalle de Existencias desde CARM 1 Store
Número de Clasificación: A2:AF37H0 F01034
Copia 1 Disponible  Hacer reserva

Ejemplares similares