Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials.

שמור ב:
מידע ביבליוגרפי
Corporate Authors: Symposium on Electron Microfractography (San Francisco), American Society for Testing and Materials. Subcommittee II on Fractography
פורמט: Conference Proceeding ספר
שפה:English
יצא לאור: Philadelphia, : American Society for Testing and Materials [1969]
סדרה:ASTM special technical publication ; 453.
נושאים:
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111 2 |a Symposium on Electron Microfractography  |c (San Francisco)  |d (1968.) 
245 1 0 |a Electron microfractography :  |b a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials. 
260 |a Philadelphia, :  |b American Society for Testing and Materials  |c [1969] 
300 |a v, 235 p. :  |b illus. ;  |c 24 cm. 
490 1 |a ASTM special technical publication 453. 
500 |a "Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals." 
504 |a Includes bibliographies. 
650 0 |a Fractography  |x Congresses. 
650 0 |a Electron microscopy  |x Congresses. 
710 2 |a American Society for Testing and Materials.  |b Subcommittee II on Fractography. 
830 0 |a ASTM special technical publication ;  |v 453. 
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