Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials.

Gorde:
Xehetasun bibliografikoak
Egile korporatiboa: Symposium on Electron Microfractography (San Francisco), American Society for Testing and Materials. Subcommittee II on Fractography
Formatua: Conference Proceeding Liburua
Hizkuntza:English
Argitaratua: Philadelphia, : American Society for Testing and Materials [1969]
Saila:ASTM special technical publication ; 453.
Gaiak:
Deskribapena
Alearen deskribapena:"Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals."
Deskribapen fisikoa:v, 235 p. : illus. ; 24 cm.
Bibliografia:Includes bibliographies.
ISBN:0803100132