Applications of electron microfractography to materials research.

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Bibliographic Details
Corporate Authors: Symposium on Applications of Electron Microfractography to Materials Research Toronto, Ont., American Society for Testing and Materials. Subcommittee II on Fractography
Format: Conference Proceeding Book
Language:English
Published: Philadelphia, : American Society for Testing and Materials [1971]
Series:ASTM special technical publication 493.
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Description
Item Description:"Presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."
Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals.
Physical Description:96 p. : illus. ; 23 cm.
Bibliography:Includes bibliographical references.