Applications of electron microfractography to materials research.
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| Corporate Authors: | , |
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Philadelphia, :
American Society for Testing and Materials
[1971]
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| Series: | ASTM special technical publication 493.
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| Subjects: |
| Item Description: | "Presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970." Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals. |
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| Physical Description: | 96 p. : illus. ; 23 cm. |
| Bibliography: | Includes bibliographical references. |