IEEE Computer Society Conference on Pattern Recognition and Image Processing, Rensselaer Polytechnic Institute, & IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis. (1977). IEEE Computer Society Conference on Pattern Recognition and Image Processing: Proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York. The Society.
Cytowanie według stylu Chicago (wyd. 17)IEEE Computer Society Conference on Pattern Recognition and Image Processing, Rensselaer Polytechnic Institute, i IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis. IEEE Computer Society Conference on Pattern Recognition and Image Processing: Proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York. Long Beach, Calif.: The Society, 1977.
Cytowanie według stylu MLA (wyd. 8)IEEE Computer Society Conference on Pattern Recognition and Image Processing, Rensselaer Polytechnic Institute, i IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis. IEEE Computer Society Conference on Pattern Recognition and Image Processing: Proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York. The Society, 1977.