Electron beam interactions with solids for microscopy, microanalysis & microlithography : proceedings of the 1st Pfefferkorn Conference, held April 18 to 23, 1982, at the Asilomar Conference Center, Monterey, CA /
Saved in:
| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
AMF O'Hare [Chicago], IL :
Scanning Electron Microscopy, Inc.,
c1984.
|
| Subjects: |
| Physical Description: | xii, 372 p. : ill. ; 29 cm. |
|---|---|
| Bibliography: | Includes bibliographies and indexes. |
| ISBN: | 0931288304 |