Materials Research Symposium National Bureau of Standards & LaFleur, P. D. (1976). Accuracy in trace analysis: Sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974. U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off..
Chicago Style (17th ed.) CitationMaterials Research Symposium National Bureau of Standards and Philip D. LaFleur. Accuracy in Trace Analysis: Sampling, Sample Handling, Analysis : Proceedings of the 7th Materials Research Symposium Held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974. Washington: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
MLA (8th ed.) CitationMaterials Research Symposium National Bureau of Standards and Philip D. LaFleur. Accuracy in Trace Analysis: Sampling, Sample Handling, Analysis : Proceedings of the 7th Materials Research Symposium Held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974. U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.