Characterization of semiconductor materials
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| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
New York,
McGraw-Hill
[1970]
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| Series: | Texas instruments electronics series
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| Subjects: |
| Physical Description: | xvi, 351 p. illus. 26 cm. |
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| Bibliography: | Includes bibliographical references. |