Trace analysis of semiconductor materials.
Bewaard in:
| Hoofdauteur: | |
|---|---|
| Formaat: | Boek |
| Taal: | English |
| Gepubliceerd in: |
Oxford, New York,
Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York]
1964.
|
| Reeks: | International series of monographs on analytical chemistry,
v. 11. |
| Onderwerpen: |
| Fysieke beschrijving: | ix, 282 p. illus. 24 cm. |
|---|---|
| Bibliografie: | Includes bibliographies. |