Unified methods for VLSI simulation and test generation /

Unified methods for VLSI simulation and test generation /

Saved in:
Bibliographic Details
Main Author: Cheng, Kwang-Ting, 1961-
Other Authors: Agrawal, Vishwani D., 1943-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, c1989.
Series:Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing #SECS 73
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Computer-aided design.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Computer simulation.

CARM 1 Store

Holdings details from CARM 1 Store
Call Number: A2:AJ21F0 C04643
Copy 1 Available  Place a Hold

Similar Items