Unified methods for VLSI simulation and test generation /

Unified methods for VLSI simulation and test generation /

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Bibliographic Details
Main Author: Cheng, Kwang-Ting, 1961-
Other Authors: Agrawal, Vishwani D., 1943-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, c1989.
Series:Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing #SECS 73
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Computer-aided design.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Computer simulation.
Description
Item Description:At head of title: AT&T.
Includes index.
Physical Description:xii, 148 p. : ill. ; 24 cm.
Bibliography:Bibliography: p. [113]-143.
ISBN:0792390253

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