Developments in integrated circuit testing /
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| 其他作者: | |
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| 格式: | 图书 |
| 语言: | English |
| 出版: |
London ; San Diego :
Academic Press,
c1987.
|
| 丛编: | Perspectives in computing (Boston, Mass.) ;
vol. 18. |
| 主题: |
| 实物描述: | x, 440 p. : ill. ; 24 cm. |
|---|---|
| 参考书目: | Includes bibliographical references (p. [407]-431). |
| ISBN: | 0124967353 |