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American Society for Testing and Materials. Committee F-1 on Electronics
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American Society for Testing and Materials. Committee F-1 on Electronics
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American Society for Testing and Materials. Committee F-1 on Electronics
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Lifetime factors in silicon : a symposium /
Published 1980
“…
American
Society
for
Testing
and
Materials
.
Committee
F
-
1
on
Electronics
…”
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Related Subjects
Electric properties
Semiconductors
Silicon